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IC200ALG240LT 卡件
.功能與參數(shù)測試
1.<測試儀>對器件的檢測,僅能反應(yīng)出截止區(qū),放大區(qū)和飽和區(qū).但不
能測出工作頻率的高低和速度的快慢等具體數(shù)值等.
2.同理對TTL數(shù)字芯片而言,也只能知道有高低電平的輸出變化.而無
法查出它的上升與下降沿的速度.
四.晶體振蕩器
1.通常只能用示波器(晶振需加電)或頻率計測試,萬用表等無法測量,
否則只能采用代換法了.
2.晶振常見故障有:a.內(nèi)部漏電,b.內(nèi)部開路c.變質(zhì)頻偏d.外圍相連電
容漏電.這里漏電現(xiàn)象,用<測試儀>的VI曲線應(yīng)能測出.
3.整板測試時可采用兩種判斷方法:a.測試時晶振附近既周圍的有關(guān)
芯片不通過.b.除晶振外沒找到其它故障點.
4.晶振常見有2種:a.兩腳.b.四腳,其中第2腳是加電源的,注意不可隨
意短路.
五.故障現(xiàn)象的分布
1.電路板故障部位的不完全統(tǒng)計:1)芯片損壞30%, 2)分立元件損壞30%,
3)連線(PCB板敷銅線)斷裂30%, 4)程序破壞或丟失10%(有上升趨勢).
2.由上可知,當(dāng)待修電路板出現(xiàn)聯(lián)線和程序有問題時,又沒有好板子,既
不熟悉它的連線,找不到原程序.此板修好的可能性就不大了.
IC200ALG240LT 卡件
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| IC200ALG264 |
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| IC200ERM001CA |
| IC200MDD846 |
| IC200ACC303 |
| IC200PWR102 |
| IC200GBI001CA |
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| IC200ETM001CA |
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| IC200MDL644 |
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| IC200ALG265 |
| IC200MDD842 |
| IC200PWR102CA |
| IC200ALG240CA |
| IC200PWR102LT |
| IC200TBM001 |
| IC200PWR012 |
| IC200MDL241CA |
| IC200MDL243CA |
| IC200MDL330CA |
| IC200ALG325CA |
| IC200UDR001-24 |
| IC200UDR164 |
| IC200UDR006 |
| IC200UAA007 |
| IC200UEX012-24 |
| IC200UDR001 |
| IC200UDD220 |
| Eberle P-41 0514-01-000-000 |
| HONEYWELL MX100PT21 |
| 1784-PCIC |
| Pilz PSS1 DI20 |
| DEIF SCM-1 |
| DAI05 |
| 1336F-BRF20-AA-?EN |
| 545-1105 |
| 103003276-6591 |
| IC693MDL940 |
| IC697ALG230E |
| 140CPS21400 |
| 4808 |
| 6ES7416-3FR05-0AB0 |
| R160530431 |
| BL210 |
| DO242/A |
| TM240/A |
| 140DDI84100 |
| 11BRW-300-F |
| CM3615T |
| 140ACI03000 |
| 140ARI03010 |
| 140CPS12420 |
| 140DA175300 |
| 140DAO85300 |
| RVT6-1/5A |
| 6FC5548-0AC11-0AA0 |
| CH-1290 |
| CS8321SCD |
| CS8321SCD |
| SM17/35-TA |
| SPM75-TB |
| EEA-PAM-535-A-32 |
| 16413-15 |
| P0973JP |
| 6DD1681-0AH2 |
| 1756-L55M14 |
| HCS02.1E-W0012-A-03-NNNN |
| VMIVME-7750 |
| ECA244-0 A244 |
| ECE243-1 E243 |
| ECNT43-0 NT43 |
| ECPA42-0 PA42 |
| ECPNC3-0 PNC3 |
| HCMCIF-0 MCIF |
| HCMCO3MC-1A MCO3MC |
| DBG11B-08 |
| MDS60A-0015-5A3-4-00 |
| MDS60A0040-5A3-4-00 |
| VLT5008 |
| 103003276-6591 |
| 1755K PMPP 1700 92-01939-00 |
| FVR008E7S-2 |
| 1746-IB16 |
